HiddenTag
HiddenTag Solution
ScanHit
SSELF
Multimedia Solution
- Flexible test to the user setup
- Error output in various formats, by grid or by group
- Supporting the detection of specially designated area with the Wafer / Circuit diagram filtering tool
- Provision of objective test results
- Product package
(Wafer / Circuit diagram filtering application, Wafer / Circuit diagram error detection library or application)
-
Flexible test to the user setup
-
Error output in various formats, by grid or by group
-
Supporting the detection of specially designated area with the Wafer / Circuit diagram filtering tool
-
Provision of objective test results
-
Product package
(Wafer / Circuit diagram filtering application, Wafer / Circuit diagram error detection library or application)
Detection of fine scratches
Detection of silicon stain
Selective area detection
Converting the detected error into x, y, theta physical coordinates, Output by group
Output of the normalized error detection results using constant grid values
Detection of cut circuit
Detection of circuit overlap
Detection of abnormal circuit length
Selective area detection from circuit diagram