• Company

  • Product&Service

  • Press Release

  • Supports

Downloads
Insert title here

Call

Inquiries

Download

Semiconductor

Test Automation

SSELF™ for Semiconductor

- Flexible test to the user setup

- Error output in various formats, by grid or by group

- Supporting the detection of specially designated area with the Wafer / Circuit diagram filtering tool

- Provision of objective test results

- Product package
(Wafer / Circuit diagram filtering application, Wafer / Circuit diagram error detection library or application)

-

Flexible test to the user setup

-

Error output in various formats, by grid or by group

-

Supporting the detection of specially designated area with the Wafer / Circuit diagram filtering tool

-

Provision of objective test results

-

Product package
(Wafer / Circuit diagram filtering application, Wafer / Circuit diagram error detection library or application)

Detection of fine scratches

Detection of silicon stain

Selective area detection

Converting the detected error into x, y, theta physical coordinates, Output by group

Output of the normalized error detection results using constant grid values

Detection of cut circuit

Detection of circuit overlap

Detection of abnormal circuit length

Selective area detection from circuit diagram